Beilstein J. Nanotechnol.2023,14, 725–737, doi:10.3762/bjnano.14.59
photogenerated carrier distributions. The analysis of the KPFM data was assisted by means of theoretical modelling simulating the energy bands profile and KPFM measurements.
Keywords: FM-KPFM; frequency-modulated Kelvin probe force microscopy; III–Vmultilayerstack; Kelvin probe modelling; KP modelling; SPV
a study about the capability of cross-sectional KPFM for the study of a III–Vmultilayerstack under ambient conditions. In particular, we have investigated an InP/GaInAs(P) multilayer structure with layers of different widths and doping concentrations.
The first objective of this analysis is the
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Figure 1:
Schematic diagram of the KPFM system employed in this analysis. While an ac + dc potential is appli...